Electrical Overstress (EOS) PDF ePub eBook

Books Info:

Electrical Overstress (EOS) free pdf

Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design. It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip, and system level EOS protection networks, followed by examples in specific technologies, circuits, and chips. The book is unique in covering the EOS manufacturing issues from on-chip design and electronic design automation to factory-level EOS program management in today s modern world.

Look inside for extensive coverage on: * Fundamentals of electrical overstress, from EOS physics, EOS time scales, safe operating area (SOA), to physical models for EOS phenomena * EOS sources in today s semiconductor manufacturing environment, and EOS program management, handling and EOS auditing processing to avoid EOS failures * EOS failures in both semiconductor devices, circuits and system * Discussion of how to distinguish between EOS events, and electrostatic discharge (ESD) events (e.g. such as human body model (HBM), charged device model (CDM), cable discharge events (CDM), charged board events (CBE), to system level IEC 61000-4-2 test events) * EOS protection on-chip design practices and how they differ from ESD protection networks and solutions * Discussion of EOS system level concerns in printed circuit boards (PCB), and manufacturing equipment * Examples of EOS issues in state-of-the-art digital, analog and power technologies including CMOS, LDMOS, and BCD * EOS design rule checking (DRC), LVS, and ERC electronic design automation (EDA) and how it is distinct from ESD EDA systems * EOS testing and qualification techniques, and * Practical off-chip ESD protection and system level solutions to provide more robust systems

Electrical Overstress (EOS): Devices, Circuits and Systems is a continuation of the author s series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the nano-electronic era.

About Steven H. Voldman

Steven H . Voldman , IEEE Fellow, Vermont, USA

Details Book

Author : Steven H. Voldman
Publisher : John Wiley
Data Published : 06 September 2013
ISBN : 1118703324
EAN : 9781118703328
Format Book : PDF, Epub, DOCx, TXT
Number of Pages : 368 pages
Age + : 15 years
Language : English
Rating :

Reviews Electrical Overstress (EOS)

17 Comments Add a comment

Related eBooks Download

  • System Level ESD Protection free pdfSystem Level ESD Protection

    This book addresses key aspects of analog integrated circuits and systems design related to system level electrostatic discharge (ESD) protection. It is an invaluable reference for anyone developing systems-on-chip (SoC) and systems-on-package (SoP)..

  • ESD Testing free pdfESD Testing

    With the evolution of semiconductor technology and global diversification of the semiconductor business. testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance..

  • Modeling of Electrical Overstress in Integrated Circuits free pdfModeling of Electrical Overstress in Integrated Circuits

    Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downward scaling of device feature sizes..

  • System Level ESD Co-Design free pdfSystem Level ESD Co-Design

    An effective and cost efficient protection of electronic system against ESD stress pulses specified by IEC 61000-4-2 is paramount for any system design. This pioneering book presents the collective knowledge of system designers and system testing experts and state-of-the-art techniques for achieving efficient system-level ESD protection..

  • VLSI Physical Design free pdfVLSI Physical Design

    Design and optimization of integrated circuits are essential to the creation of new semiconductor chips. and physical optimizations are becoming more prominent as a result of semiconductor scaling. Modern chip design has become so complex that it is largely performed by specialized software..

  • Electrical Overstress (EOS) free pdfElectrical Overstress (EOS)


    Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fund